鄭順林(Shuen-Lin Jeng)教授基本資料

按下開啟原圖
姓名:
鄭順林(Shuen-Lin Jeng)
職稱:
副教授
辦公室:
管理學院統計系館3樓62317室
聯絡電話:
(06)2757575~53640
電子郵件:
Office Hours: 9:00-11:00AM Monday
9:00-12:00AM Tuesday
    ☉主要學歷(Educational Background):
      美國愛荷華州立大學統計博士
      輔仁大學數學研究所碩士
      成功大學數學系學士

    ☉相關經歷(Main Experiences):
      Associate Professor
      Department of Statistics, Tunghai University, 08/2003-01/2007

      Assistant Professor
      Department of Statistics, Tunghai University, 08/2000-07/2003

      Assistant Professor
      Department of Statistics, Ming Chuan University, 08/1998-07/2000

      Visiting scholar
      School of Mathematics, Beijing Institute of Technology,03/07/2012-18/07/2012. Visited Professor Yubin Tian.

      Visiting scholar
      Beijing Institute of Genomics, Chinese Academy of Science, 08/10/2011-04/11/2011. Visited Professor Chung-I Wu.

      Visiting scholar
      Vanderbilt Center for Quantitative Sciences, Vanderbilt University, 27/03/2011-07/04/2011. Visited Professor Yu Shyr.

      Visiting scholar
      Industrial and systems engineering, Georgia Institute of Technology, 01/2005-09/2005. Visited Professor C. F. Jeff Wu.

      Associate editor
      International Journal of Quality, Statistics, and Reliability, 2007-now.

      Associate editor
      Journal of Chinese Statistical Association, 2012-now.
       
      Associate editor
      Journal of Quality, 2009-now.

      Guest editor
      The special issue for Nano-reliability of IEEE transactions on Reliability, 2007.

      Member of the Chinese Institute of Probability and Statistics (CIPS).

      Member of the Chinese Statistical Association (CSA).

      Member of the Chung-hua Data Mining Society (CDMS).

      榕園統計文教基金會董事(2011.1~now)


    ☉專長領域(Specialties):
      可靠度分析
      工業統計
      資料採礦
      統計計算

    ☉研究方向(Research Field):
      加速壽命測試
      隨機過程退化模型
      晶圓影像辨識和分類
      晶圓製程資料分析與錯誤偵測
      保固資料分析和預測
      巨量資料分析
      次世代測序資料分析


學年度
學期
開課班級
必/選修
學分
科目名稱
授課老師
下載
104
學士二
選修
3
品質管制
鄭順林
 
104
學士四
必修
3
統計資料分析
鄭順林
 
103
學士二
必修
3
迴歸分析
鄭順林
 
103
碩博班
選修
3
統計資料採礦
鄭順林
 
103
學士三
選修
3
統計模擬
鄭順林
103
學士二
必選
3
程式設計
鄭順林
102
碩博班
選修
3
可靠度分析
鄭順林
102
學士二
必修
3
迴歸分析
鄭順林
102
學士三
必修
3
實驗設計
鄭順林
102
學士四
選修
3
工業統計
鄭順林
101
碩博班
選修
3
統計資料採礦
鄭順林
101
學士三
選修
3
統計模擬
鄭順林
101
學士四
選修
3
工業統計
鄭順林
101
學士三
必修
3
實驗設計
鄭順林
100
碩博班
選修
3
可靠度分析
鄭順林
100
碩士班
必選
3
數理統計(二)
鄭順林
99
碩博班
選修
3
統計資料採礦
鄭順林
99
博士班
選修
3
統計專題:時間數列資料採礦(二)
鄭順林
99
學士二
選修
3
統計軟體與繪圖
鄭順林
99
學士三
必修
3
實驗設計
鄭順林
99
學士四
選修
3
工業設計
鄭順林
99
博士班
選修
3
統計專題研究:時間數列資料採礦
鄭順林
98
學士二
選修
3
品質管制
鄭順林
98
碩博班
選修
3
可靠度分析
鄭順林
98
學士三
必修
3
實驗設計
鄭順林
97
碩博班
選修
3
統計資料採礦
鄭順林
97
學士二
選修
3
統計繪圖軟體
鄭順林
97
學士四
選修
3
工業統計
鄭順林
97
學士三
必修
3
實驗設計
鄭順林
96
學士二
選修
3
統計軟體與繪圖
鄭順林
96
碩博班
必修
2
專題討論
鄭順林
 
96
學士四
選修
3
工業統計
鄭順林
96
碩博班
選修
3
統計資料採礦
鄭順林
96
碩博班
必修
2
專題討論
鄭順林
 


期刊論文
  1.  Min-Hsiung Hsieh, Shuen-Lin Jeng *, and Paul Kvam2017, Critical Fault-Detecting Time Evaluation in Software with Discrete Compound Poisson Models. Journal of Quality Technology (Accepted, 20171013).
  2.  Ya-Chi Lin, Joseph T. Tseng, Shuen-Lin Jeng, H. Sunny Sun.2014, Comprehensive analysis of common coding sequence variants in Taiwanese Han Population. Biomarkers and Genomic Medicine. Vol. 6, No. 4, 133-143.
  3.  Jeng, S.-L.*, Wu, Y.-F., and Liu, T.-L.2013, Improving De Novo Assembly by Pre-Processing the Next-Generation Sequencing Data. Journal of Chinese Statistical Association. Vol. 51, 351-372.(CIS, JEL, EconLit)
  4.  Jeng, S.-L.* and Huang, B.-Y., and Meeker, W. Q.2011, 'Accelerated Destructive Degradation Tests Robust to Distribution Misspeci cation,' IEEE Transactions on Reliability. Vol. 60, No. 4, 701-711.[SCI]
  5.  Jeng, S.-L.* and Liu, Y.-D.2011, "Adaptive Tangent Distance Classi er on Recognition of Handwritten Digits,`` Journal of Applied Statistics. Vol. 38, No. 11, 2647-2659.[SCI]
  6.  Hsieh, M.-H. and Jeng, S.-L.*2009, “Assessing Device Reliability Based on Scheduled Discrete Degradation Measurements,” Probabilistic Engineering Mechanics. Vol. 24, No. 2, 151-158. 【SCI】
  7.  Lu, J.-C.*, Jeng, S.-L, and Wang, K.2009, “A Review of Statistical Methods for Quality Improvement and Control in Nanotechnology,” Journal of Quality Technology. Vol. 41, No. 2, 148-164. 【SCI】
  8.  Jeng, S.-L., Joseph, R., and Wu, J.2008, “Modeling and Analysis for Failure Amplification Method,” Journal of Quality Technology. Vol. 40, No. 2, 128-139. 【SCI】(NSC 43140F)
  9.  Jeng, S.-L. and Huang, Y.-T.2008, “Time Series Classification based on Spectral Analysis,” Communications in Statistics: Simulation and Calculation. Vol. 37, No. 1, 132-142.【SCI】
  10.  Jeng, S.-L., Lu, J.-C., and Wang, K.2007, “A Review of Reliability Research on Nanotechnology,” IEEE Transactions on Reliability, Vol. 56, No. 3, 401-410. 【SCI】
  11.  Hsieh, M.-H. and Jeng, S.-L.2007, “Accelerated Discrete Degradation Models for Leakage Current of Ultra-thin Gate Oxides,” IEEE Transactions on Reliability. Vol. 56, No. 3, 369-380.【SCI】
  12.  Chang, W.-K. and Jeng, S.-L.2007, “Practical stopping criteria for validating safetycritical software by estimating impartial reliability,” Applied Mathematical Modelling, Vol. 31,Issue 7, pp 1411-1424.【SCI】
  13.  Jeng, S.-L., S. N. Lahiri, and W. Q. Meeker2005, “Asymptotic Properties of Bootstrapped Likelihood Ratio Statistics for Time Censored Data,” Statistica Sinica, Vol. 15, No. 1, pp. 35-58.【SCI】
  14.  Chang, W.-K. and Jeng, S.-L.2005, “Impartial Evaluation in Software Reliability Practice,” Journal of System and Software, Vol. 76, No. 2, pp. 99-110.【SCI】
  15.  Jeng, S.-L.2003, “Inferences for the Fatigue Life Model Based on the Birnbaum-Saunders Distribution,” Communications in Statistics: Simulation and Computation, VOL. 32, Issue 1, pp. 43-60.【SCI】
  16.  Jeng, S.-L. 2003, “Exact Sample Size Determination in a Weibull Test Plan When There is Time Censoring,” Journal of Statistical Computation and Simulation, Vol. 73, No. 6,pp. 389-408.【SCI】
  17.  Jeng, S.-L., and Meeker, W. Q.2001, Parametric Simultaneous Confidence Bands for Cumulative Distributions from Life Data. Technometrics, Nov. 2001, VOL. 43, NO. 4, pp. 450-461.(SCI)
  18.  Jeng, S.-L., and Meeker, W. Q.2000, Comparisons of Approximate Confidence Intervals for Type I Censored data. Technometrics, May 2000, VOL. 42, NO. 2, pp.135-148, discussion pp.156-159.(SCI)

會議論文
  1.  Jeng, S.-L. and Hsieh, M.-S. 2009, Mixed Degradation Models for Reliability Inferences, Mathematical Methods in Reliability, Moscow, Russia, June 22-27, 2009.
  2.  27. Jeng, S.-L. and Huang, B.-Y.2009, Robust Test Plan for Accelerated Destructive Degradation Test, Joint Statistical Meetings, Washington DC, USA. August 1-6, 2009.
  3.  25. Jeng, S.-L. and Hsieh, M.-S.2008, Application of Degradation Models on Reliability Assessment of Transistors, 2008 Mathematical Meeting and Annual Meeting of the Mathematical Society, HsinChu, Taiwan. Invited. December 19-21, 2008.
  4.  Jeng, S.-L.2008, Planning Accelerated Degradation Tests with Random Coefficient Models, Joint Statistical Meetings, Denver, USA. August 2-7, 2008.
  5.  Jeng, S.-L.2007,  Accelerated Life Test and Failure Amplification Method, International Conference on Multiple Decision Theory. Invited. December 28-30, 2007.
  6.  Jeng, S.-L. and Hsieh, M.-S.2007,  Reliability Inference Using Scheduled Degradation Data, 56th Session of the ISI INTERNATIONAL STATISTICAL INSTITUTE, Liboa, Portugal. August 22-29, 2007.
  7.  Jeng, S.-L.2007,  Some Degradation Measurements and Models on Nano Reliability, The 2007 Taipei International Statistical Symposium and ICSA International Conference, June 25-27, 2007. Invited talk.
  8.  Hsieh, M.-H. and Jeng, S.-L.2006,  A Discrete Degradation Model for Ultra-Thin Gate Oxide Data, Joint Statistical Meetings, Seatle, USA. August 6-10,2006.
  9.  Jeng, S.-L.2005,  Finding Failure Time Distributions Based on Models of Degradation Rate, Annual Conference of Chinese Statistical Association, December 10, 2005.
  10.  Lu, J.-C. and Jeng, S.-L.2005,  Engineering Physics-based Degradation Models, Joint Statistical Meetings, Minneapolis, USA. August 7-11,2005.
  11.  Jeng, S.-L.2005,  Prediction Error Comparisons of Failure Distribution for Accelerated Degradation Tests, Joint Statistical Meetings, Minneapolis, USA. August 7-11,2005.
  12.  Lu, J.-C., Jeng, S.-L., S. C. Lin, Ni Wang and M. K. Jeong2005,  Quality, Reliability and Statistics in Nano-Technology, The International Federation of Operational Research Societies, Honolulu, Hawaii, July 11-15, 2005.
  13.  Jeng, S.-L.2004,  Nonparametric Failure Distribution Analysis for Accelerated Degradation Test, Joint Statistical Meetings, Toronto, Canada. August 7-11,2004.
  14.  Jeng, S.-L. and Liu, Y.-T.2004,  Discriminant Adaptive Nearest Neighbor and Tangent Distance Classifier on Handwritten Recognition Problems, Annual Conference of Chinese Institute of Probability and Statistics, Taipei, Taiwan. June 24-25, 2004.
  15.  Jeng, S.-L.2003,  Estimation of Failure Distribution Parameters from Degradation Data, Annual Conference of Chinese Statistical Association, November 22, 2003.
  16.  Jeng,S.-L.2003,  Planning Accelerated Life Tests under the Inverse Gaussian Model, 2003 International Statistical Institute, Berlin, Germany. August 20, 2003.
  17.  Jeng, S.-L. and Huang, L.-W.2003,  Exploring the Stochastic Boosting Projected Additive Regression Splines on Classification Problems, Annual Conference of Chinese Institute of Probability and Statistics, June 26, 27, 2003.
  18.  Chang, W.-K. and Jeng, S.-L.2003,  Impartial Estimation on Software Reliability Modeling, The Fifth Chinese Symposium on Reliability and Maintainability, Taichung, Taiwan. November 28, 2003.
  19.  Jeng, S.-L.2002,  Sample Size Problems of the Optimum Plan for Accelerated Life Test under Inverse Gaussian Distribution, the 2002 Taipei International Statistical Symposium and Bernoulli Society EAPR Conference, Taipei, Taiwan. July 7-10, 2002.
  20.  Jeng, S.-L.2001,  Fisher Information or Local Information?– Testing and Confidence Intervals Procedure with Censored Data under Location-scale Models. Annual Conference of Chinese Statistical Association, December 8, 2001.
  21.  Jeng, S.-L.2001,  Inferences for the Fatigue Life Model Based on the Birnbaum-Saunders Distribution, The Third Conference of Probability and Statistics for China and Taiwan, Taipei, Taiwan. April 14-15, 2001.
  22.  Jeng, S.-L.2001,  The Uncertainty of the Estimation for the Probability of Detection Curves. Industrial Statistics Workshop, Hsin-Chu, Taiwan. January 10, 2001.
  23.  Jeng, S.-L.2000,  Simulated Confidence Intervals in Life Data Analysis Using Parametric Models, Annual Conference of Chinese Statistical Association, May 27-28, 2000.
  24.  Jeng, S.-L.2000,  Cautions in Using Bootstrap Procedures for Type I Censored Data, Annual Conference of Chinese Institute of Probability and Statistics, April 15, 2000.
  25.  Meeker, W. Q., Jeng, S.-L., Chiou, C-P, and Thompson, R. B.1998,  Improved methodology for Inspection Reliability Assessment for Detecting Synthetic Hard Alpha Inclusions in Titanium, Review of Progress in Quantitative Nondestructive Evaluation, Thompson, D.O. and Chimenti, D.E.,Eds., Vol. 17,(Plenum Press, NY, 1998).
  26.  Meeker, W. Q., Jeng, S.-L., Chiou, C-P, and Thompson, R. B.1997,  Improved Methodology for Predicting POD of Detecting Synthetic Hard Alpha Inclusions in Titanium, Review of Progress in Quantitative Nondestructive Evaluation, 17B, Thompson, D.O. and Chimenti, D.E., Eds. (Plenum Press, NY), 2021-2028.
  27.  Meeker, W.Q., Thompson, R.B., Chiou, C.P., Jeng, S.L., and Tucker, W.T.1996,  Methodology for Estimating Nondestructive Evaluation Capability, In Thompson, D. O. and Chimenti, D. E., editors, Review of Progress in Quantita- tive Nondestructive Evaluation 15, 1983-1991. Plenum Press.


其他著作
  1.  11. Jeng, S.-L. and Yen, C.-L2009, Robust Multivariate Control Chart for Monitoring Variability.
  2.  Jeng, S.-L.2008, 奈米可靠度中衰退模型之研究
  3.  Jeng, S.-L2007, 泊松累積損毀過程下衰退資料之初越分配建模研究 (2"2)
  4.  Jeng, S.-L.2006, 泊松累積損毀過程下衰退資料之初越分配建模研究 (1"2)
  5.  Jeng, S.-L.2005,  Planning Accelerated Degradation Tests with Continuous Wiener and Discrete Marked Point Damage Processes(2"2)
  6.  Jeng, S.-L.2004, Planning Accelerated Degradation Tests with Continuous Wiener and Discrete Marked Point Damage Processes(1"2)
  7.  Jeng, S.-L2003, Sample Size Determination for the Accelerated Life Test(2"2)
  8.  Jeng, S.-L2002, Sample Size Determination for the Accelerated Life Test
  9.  Jeng, S.-L2001, 設限資料之下精確估計所需樣本大小之研究
  10.  Jeng, S.-L2000, 壽命資料的聯立信賴區帶與區間
  11.  Jeng, S.-L1999, Accurate Confidence Intervals for Progressive Censored Data



畢業年份
班別
作者
論文題目
指導教授
資料下載
2015
碩士班
楊欣曄
基於關連結構的雙變量退化模型及其推論 鄭順林
2015
碩士班
葉耿傑
非線性混合效用模型下之重複量測加速衰變測試規劃 鄭順林
2014
碩士班
張惇皓
基於剖面資料進行多階段製程建模之研究 鄭順林
2013
碩士班
林振宇
次世代測序研究--藉由相似物種的比對以評估全新序列組裝 鄭順林
2013
碩士班
宋碧樺
建構使用中產品失效率預測區間以保固政策效應下市場故障資料為例 鄭順林
2013
碩士班
董琝
Michaelis-Menten與相關模型最適設計探討 鄭順林
2012
碩士班
盧名慧
考慮保固政策效應下基於市場故障資料之可靠度分析 鄭順林
2012
碩士班
莊翼陽
藉由彈性的血液反應函數對功能性核磁共振資料建模之分析比較 鄭順林
2012
碩士班
吳宥甫
藉由次世代測序資料的品質評估以及錯誤校正改善非模式物種的基因組裝 鄭順林
2011
碩士班
吳萱萱
失效放大因子在壽命測試中的角色探討 鄭順林
2011
碩士班
陳威仁
應用統計方法降低像臉實驗的功能性核磁共振資料之噪音干擾 鄭順林
2010
碩士班
陳明宏
應用空間檢定與空間集群分析於晶圓圖與功能性核磁共振影像資料 鄭順林
2010
碩士班
陳彥予
使用褶積模型應用於有銷售與回報時間延遲之保固維修資料研究 鄭順林
2010
碩士班
傅馨儀
高維度資料的交互作用模型建立-應用於單一核甘酸多型性的全基因相關性研究和拉曼光譜研究 鄭順林
2009
碩士班
何冠儒
高維度資料中交互作用模型的選擇–應用於單一核甘酸多型性的全基因相關性研究 鄭順林
2009
碩士班
黃蓓盈
加速破壞性衰變測試中分配誤判之穩健實驗規劃 鄭順林
2008
碩士班
翁茂虔
應用空間檢定與不變性轉換距離於晶圓圖分類問題 鄭順林
2008
碩士班
林士豪
加速衰變實驗中隨機線性模型之實驗規畫 鄭順林
    獎勵或榮譽(Honors):
      103學年度成功大學全校教學特優教師
      101學年度統計系服務優良教師
      99學年度成功大學全校教學優良教師
      99學年度成功大學管理學院研究優良教師

      Elected Member of the International Statistical Institute, 2004.

      Prize for the Best Theoretical Paper in the Chinese Fifth Symposium on Reliability and Maintainability, 2003, paper title: "Impartial Estimation on Software Reliability Modeling".